Descripción de prueba
- J. M. Iglesias, A. Nardone, R. Rengel, K. Kalna, M. J. Martín, and E. Pascual
- 2D Materials 14, 025011 (2023)
34. High-order harmonic generation in 2D transition metal disulphides
- J. M. Iglesias, E. Pascual, M. J. Martín, and R. Rengel
- Applied Physics Letters 119, 012101 (2021)
33. Harmonic Extraction in Graphene: Monte Carlo Analysis of the Substrate Influence
- E. Pascual, J. M. Iglesias, M. J. Martín, and R. Rengel
- Materials 14, 5108 (2021)
- R. Rengel, O. Castelló, E. Pascual, M. J. Martín, and J. M. Iglesias
- Journal of Physics D: Applied Physics 59, 395102 (2020)
31. Relevance of collinear processes to the ultrafast dynamics of photoexcited carriers in graphene
- J. M. Iglesias, E. Pascual, M. J. Martín, and R. Rengel
- Physica E: Low-dimensional Systems and Nanostructures 123, 114211 (2020)
30. Electronic transport and noise characterization in MoS2
- E. Pascual, J. M. Iglesias, M. J. Martín, and R. Rengel
- Semiconductor Science and Technology 35, 055021 (2020)
29. Experiences on the Design, Creation, and Analysis of Multimedia Content to Promote Active Learning
- R. Rengel, E. Pascual, I. Íñiguez-de-la-Torre, M. J. Martín, and B. G. Vasallo
- Journal of Science Education and Technology 28, 445 (2019)
28. Interband scattering-induced ambipolar transport in graphene
- J. M. Iglesias, E. Pascual, M. J. Martín, and R. Rengel
- Semiconductor Science and Technology 34, 065011 (2019)
27. Monte Carlo investigation of noise and high-order harmonic extraction in graphene
- J. M. Iglesias, E. M. Hamham, E. Pascual, and R. Rengel
- Semiconductor Science and Technology 33, 124012 (2018)
26. Impact of the hot phonon effect on electronic transport in monolayer silicene
- E. M. Hamham, J. M. Iglesias, E. Pascual, M. J. Martín, and R. Rengel
- Journal of Physics D: Applied Physics 51, 415102 (2018)
25. Substrate influence on the early relaxation stages of photoexcited carriers in monolayer graphene
- J. M. Iglesias, M. J. Martín, E. Pascual and R. Rengel
- Applied Surface Science 424, 52-57 (2017)
- J. M. Iglesias, R. Rengel, Hamham E. M., E. Pascual and M. J. Martín
- Journal of Physics D: Applied Physics 50, 305101 (2017)
23. A balance equations approach for the study of the dynamic response and electronic noise in graphene
- R. Rengel, J. M. Iglesias, E. Pascual and M. J. Martín
- Journal of Applied Physics 121, 185705 (2017)
22. Noise temperature in graphene at high frequencies
- R. Rengel, J. M. Iglesias, E. Pascual and M. J. Martín
- Semiconductor Science and Technology 31, 075001 [1-6] (2016)
21. Spectral density of velocity fluctuations under switching field conditions in graphene
- J. M. Iglesias, M. J. Martín, E. Pascual and R. Rengel
- Journal of Statistical Mechanics: Theory and Experiment 2016, 054018 [1 8] (2016)
- J. M. Iglesias, M. J. Martín, E. Pascual and R. Rengel
- Applied Physics Letters 108, 043105 (2016)
19. Influence of systematic gate alignment variations on static characteristics in DG-SB-MOSFETs
- J. M. Iglesias, M. J. Martín, E. Pascual and R. Rengel
- 2015 10th Spanish Conference on Electron Devices DOI: 10.1109/CDE.2015.7087481 (2015)
18. Monte Carlo modeling of mobility and microscopic charge transport in supported graphene
- R. Rengel, J. M. Iglesias, E. Pascual and M. J. Martín
- 2015 10th Spanish Conference on Electron Devices DOI: 10.1109/CDE.2015.7087445 (2015)
17. Effect of charged impurity scattering on the electron diffusivity and mobility in graphene
- R. Rengel, J. M. Iglesias, E. Pascual and M. J. Martín
- Journal of Physics: Conference Series 647, 012046 [1-4] (2015)
- J. M. Iglesias, M. J. Martín, E. Pascual and R. Rengel
- Journal of Physics: Conference Series 647, 012003 (2015)
- M. J. Martín, C. Couso, E. Pascual and R. Rengel
- IEEE Transactions on Electron Devices 99, 3955 (2014)
- R. Rengel, E. Pascual and M. J. Martín
- Applied Physics Letters 104, 233107 (2014)
13. Effect of the dopant segregation layer on the static characteristics of Schottky-Barrier n-MOSFETs
- C. Couso, E. Pascual, J. M. Galeote, M. J. Martín and R. Rengel
- 8th Internacional Caribbean Conferencia on Devices, Circuits and Systems (ICCDCS 2012), 2012, pp. 1-4 ISBN: 978-1-4577-1116-9 , DOI: 10.1109/ICCDCS.2012.6188919 (2012)
12. RF dynamic and noise performance of Metallic Source/Drain SOI n-MOSFETs
- M. J. Martín, E. Pascual and R. Rengel
- Solid-State Electronics 73, 64–73 (2012)
11. A Monte Carlo model for the study of n-type strained Silicon Schottky Diodes
- J. M. Galeote, R. Rengel, E. Pascual, and M. J. Martín
- 2011 Spanish Conference on Electron Devices, IEEE Catalog, 2011, #121 (2011)
10. Intrinsic Noise Sources in a Schottky Barrier MOSFET: a Monte Carlo Analysis
- E. Pascual, R. Rengel and M. J. Martín
- Proceedings of the 20th International Conference on Noise and Fluctuations, AIP Conference Proceedings 1129, 2009, pp. 329-332 (2009)
9. Current drive in n-type Schottky Barrier MOSFETs: a Monte Carlo study
- E. Pascual, R. Rengel and M. J. Martín
- 2009 Spanish Conference on Electron Devices, IEEE Catalog CFP09589, 2009, pp. 108-111. (2009)
8. Enhanced carrier injection in Schottky contacts using dopant segregation: a Monte Carlo research
- E. Pascual , M. J. Martín , R. Rengel, G. Larrieu and E. Dubois
- Semiconductor Science and Technology 24, 025022 [1-6] (2009)
- M. J. Martín, R. Rengel, E. Pascual, J. £usakowski, W. Knap and T. González
- Physica Status Solidi (c) 5, 123-126 (2008)
- E. Pascual, R. Rengel, N. Reckinger, X. Tang, V. Bayot, E. Dubois, M. J. Martín
- Physica Status Solidi (c) 5, 119-122 (2008)
5. RF noise and scaling in nanometer SOI MOSFETs: influence of quasiballistic transport
- M. J. Martín, R. Rengel, E. Pascual and T. González
- Proceedings of the 19th International Conference on Noise and Fluctuations, AIP Conference Proceedings 922, 2007, pp. 99-102 (2007)
- E. Pascual, R. Rengel y M. J. Martín
- 2007 Spanish Conference on Electron Devices, IEEE Catalog 07EX1644, 2007, pp. 108-111 (2007)
- M. J. Martín, R. Rengel, E. Pascual and T. González
- 2007 Spanish Conference on Electron Devices, IEEE Catalog 07EX1644, 2007, pp. 340-343 (2007)
- E. Pascual, R. Rengel and M. J. Martín
- Semiconductor Science and Technology 22, 1003-1009 (2007)
- R. Rengel, E. Pascual and M. J. Martín
- IEEE Electron Device Letters 28, 171-173 (2007)