CONFERENCE PROCEEDINGS


Conference Proceedings published on 1993.


5. The microscopic interpretation of electron noise in Schottky-barrier diodes

- T. González, D. Pardo, L. Varani and L. Reggiani
- Proceedings of the 23rd European Solid State Device Research Conference, Editions Frontiers, 1993, pp. 115-118. (1993)

4. Monte Carlo analysis of voltage fluctuations in two-terminal semiconductor devices

- T. González, D. Pardo, L. Varani and L. Reggiani
- Simulation of Semiconductor Devices and Processes Vol. 5, Springer-Verlag, 1993, pp. 193-196. (1993)

3. Number and current fluctuations in submicron semiconductor structures

- L. Varani, L. Reggiani, T. Kuhn, P. Houlet, J. C. Vaissiere, J. P. Nougier, T. González and D. Pardo
- Noise in Physical Systems and 1/f fluctuations, AIP Conference Proceedings 285, 1993, pp. 329-332. (1993)

2. Spatial analysis of voltage fluctuations in semiconductor n+nn+ structures

- T. González, D. Pardo, L. Varani and L. Reggiani
- Noise in Physical Systems and 1/f fluctuations, AIP Conference Proceedings 285, 1993, pp. 220-223. (1993)

1. Simulación de estructuras n+nn+ submicrométricas de GaAs e InP. Influencia de los modelos de las bandas de conducción

- T. González, J. E. Velázquez y D. Pardo
- Microelectrónica 92: Tecnologías, Diseño, Aplicaciones, Universidad de Cantabria, 1993, pp. 100-102. (1993)


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